This Slice & Dice Sampler Dungeon will put your timing skills to the test using the Splatchet gadget. The aim is to take out all targets in one go, but even failing one target results in having to start over for that level. While it may be easy at first, timing and quick turning skills are needed for the more challenging levels. This guide will show you through each checkpoint step by step, making it easier to clear the dungeon and earn your reward.
Slice & Dice Sampler Dungeon
Slice & Dice Sampler Dungeon may have some challenges for you. In this particular dungeon, you are only allowed to use Splatchet to kill all the targets, but you have to kill each one of them in one dash; otherwise, the other targets will disappear, and you will have to replay that section. Get into position before the first target and then use the Splatchet. Your character will dash through them all and make a slash to finish off the rest of them.
Checkpoint 1
Rather than standing straight, place yourself on an angle such that the dash passes through the targets. At the last point, turn your character to take the curved path, such that the last slash breaks all the targets.
Checkpoint 2
Set yourself up properly so that your dash goes through the straight portion first. As soon as you hit the end, spin around immediately to hit the remaining targets with the dash.
Checkpoint 3
First, stand in front of the first target. Focus on the moving targets until they are about to get aligned. The moment they are aligned, launch the Splatchet attack. In your dash, manoeuvre towards the final moving targets so that you hit them all with your slashing.
Checkpoint 4
To clear it, stand near the right corner of the target group closest to the checkpoint. You position yourself facing diagonally to ensure that your dash runs diagonally across the targets to the far side. When you arrive at the end of the dash, you immediately turn to face the other group of targets. Once you finish the dungeon, you’ll earn a Skill Point that you can use to upgrade your Tank.
